JEOL JSM-840F


Location: Begbroke - Hirsch building 317.10.33
Telephone: None.
Contact: Jennifer Holter

The JEOL 840F was installed in 1992. It has a cold cathode field emission gun and operates between 0.5 and 40 kV.

Using secondary electron imaging, the best resolution attainable on high contrast samples (Au on C) is 1.8 nm at 35 kV.

Facilities available on this instrument

  • Conventional secondary electron imaging of surface topography.
  • DISS 5 digital image acquisition and processing system.