The Department of Materials has a long and distinguished record of research in Electron Microscopy and Microanalysis, especially in the areas of technique development, defect analysis and high resolution microscopy. In addition, electron microscopy and microanalysis are an integral part of many research activities of other groups in the Department, including processing, polymers and ceramics, and there is a strong interaction with the modelling group.
In recent years the EM&M Group has undergone major growth, including expansion into the Begbroke site and the installation of the world's first double aberration-corrected TEM/STEM. Professor David Cockayne retired in September 2009, and is now an Emeritus member of the group which includes Professor Kirkland and Drs Hutchison and Nellist as academic staff. Research is expanding into new research areas, and seeking collaborations. It has a well-developed formal and informal postgraduate training programme, in modular form, and a seminar series. An innovative schools outreach programme has a remotely accessible SEM (Oxford CyberSEM), supported by modules aimed at the school curriculum. Collaborations with JEOL through the JEOL Applications Laboratory at the Begbroke Site of the University involve the new aberration corrected FEG(S)TEM and the remote microscopy project.
LATEST UPDATES:
(19 Jan 2010) Schedule (pdf) of Frontiers in Microscopy Lectures
(19 Jan 2010) New list of Hilary Term Characterisation Seminars
