Instruments

The Department of Material has always had an extensive range of instruments for electron microscopy and microanalysis.

The facilities can be broadly categorised as transmission electron microscopes, scanning electron microscopes, focussed ion beam systems and other systems.

Transmission Scanning
  • JEOL ARM-200F
  • JEOL JEM-3000F FEGTEM
  • JEOL JEM-2100
  • JEOL JEM-2200MCO FEGTEM
  • JEOL JSM-5510
  • JEOL JSM-6500F
  • JEOL JSM-840F
  • Zeiss Merlin Analytical
  • Zeiss Merlin - EBSD
  • Zeiss EVO
  • Focussed Ion Beam  
  • Zeiss NVision 40 FIB-SEM
  • Zeiss Auriga FIB-SEM
  • Zeiss Crossbeam 540
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