Location: Holder building room 154.00.11
Contact: Jennifer Holter
The JEOL JSM-5510LV has a tungsten filament and operates between 0.5 and 30 kV. It has a resolution of 3.5 nm at 30 kV in high vacuum mode and 4.5 nm in low vacuum mode. Its pressure range is 1 to 270Pa.
The instrument features an Oxford Instruments SDD dteector and AZtec EDS analysis software
- Conventional secondary electron imaging of surface topography.
- Back scattered electron imaging with annular detector, for compositional and topographical images