Gatan PECS

Location: Holder building room 154.00.14

Contact: Jennifer Holter or Ian Griffiths

The Gatan PECS II instrument is a broad beam Ar ion mill designed to polish and coat samples for SEM imaging and analytical techniques.

  • Etch at voltages as low as 100 V for rapid and damage free preparation of sample surfaces 
  • Permit samples as large as 32 mm in diameter
  • Transfer samples from the PECS™ II instrument to a SEM/FIB or glovebox without exposure to air.
  • Store and analyze image in DigitalMicrograph® software from Gatan for digital optical imaging
  • Display and control all PECS II parameters using integrated 10-inch color touch screen


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