Location: Holder building room 154.00.21A
Contact: Ian Griffiths
The Fischione NanoMill combines the gentle milling of Ar ions with the resolution of a FIB, allowing low energy cleaning of TEM specimens.
A concentrated ion beam allows for the removal of amorphous and implanted material, improving sample quality and preparation artefacts. This is ideal for both FIB prepared, and conventionally polished samples.
A liquid nitrogen cooling stage provides low temperature milling reducing phase changes in suceptable material.
The NanoMill has an anerobic loading system to ensure air-sensitive materials can be studied.