Fischione NanoMill 1040

Location: Holder building room 154.00.21A

Contact: Ian Griffiths

The Fischione NanoMill combines the gentle milling of Ar ions with the resolution of a FIB, allowing low energy cleaning of TEM specimens.

A concentrated ion beam allows for the removal of amorphous and implanted material, improving sample quality and preparation artefacts. This is ideal for both FIB prepared, and conventionally polished samples.

A liquid nitrogen cooling stage provides low temperature milling reducing phase changes in suceptable material.

The NanoMill has an anerobic loading system to ensure air-sensitive materials can be studied.


Fischione Model 1040 NanoMill® TEM specimen preparation system