Location: Holder building room 154.00.11
Contact: Gareth Hughes
The Zeiss Crossbeam 540 is a state of the art FIB/SEM system featuring the Zeiss Capella FIB column and Gemini II SEM column. Funded by an EPSRC grant, the instrument is primed for both nanofabrication and analytical work. For the latter, the system is fitted with the Oxford Instruments XMaxN 150 EDX detector and Nordlys Max EBSD system. This will give the ability to acquire 3-dimensional datasets containing chemical and crystallographic data.
The system is also equippred for nanofabrication and serial cross sectional imaging using the advanced Zeiss Atlas 5 imaging and patterning engine, which can pattern complex 3D shapes and be used to create 3D image stacks with signals from multiple detectors.
TEM and atom probe sample preparation is available on this instrument through the high currnet Capella FIB column and Oxford Instruments Omniprobe 400 micromanipulator.
If you would like more information as to the capabilities of the system, or to discuss access or collaborative work on the system, please contact us at email@example.com.