FIB Instruments

The Department of Materials currently runs four Focused Ion Beam systems. These range from the basic FEI single beam  FIB 200-TEM insturment to the advanced dual column Zeiss FIB/SEM systems of the Nvision 40, Auriga and Crossbeam 540.

A wide variety of applications can be carried out on these instruments, from patternig applications, 3D slice and view, to site specific sample prepartion for techniques such as TEM and atom probe analysis. 

For more information, click on the links to the left.