JEOL ARM-200F
Analytical STEM
Location: Holder building room 154.00.11
Contact: Ian Griffiths
This microscope is funded by an EPSRC grant held jointly between the Universities of Bristol, Oxford and Southampton.
Cold field emission source (CFEG) Cs probe corrected 200kV TEM (STEM).
High resolution analytical TEM with Cs probe, featuring 100mm2 Centurion EDX detector and Gatan GIF Quantum 965 ER featuring Dual EELS and EFTEM capabilities.
JEOL ARM-200F
